Random Positional Deviations Correction for Each LED via ePIE in Fourier Ptychographic Microscopy
نویسندگان
چکیده
منابع مشابه
Quantitative phase imaging via Fourier ptychographic microscopy.
Fourier ptychographic microscopy (FPM) is a recently developed imaging modality that uses angularly varying illumination to extend a system's performance beyond the limit defined by its optical components. The FPM technique applies a novel phase-retrieval procedure to achieve resolution enhancement and complex image recovery. In this Letter, we compare FPM data to theoretical prediction and pha...
متن کاملFast and robust misalignment correction of Fourier ptychographic microscopy
Fourier ptychographic microscopy (FPM) is a newly developed computational imaging technique that can provide gigapixel images with both high resolution (HR) and wide field of view (FOV). However, the position misalignment of the LED array induces a degradation of the reconstructed image, especially in the regions away from the optical axis. In this paper, we propose a robust and fast method to ...
متن کاملAperture scanning Fourier ptychographic microscopy.
Fourier ptychographic microscopy (FPM) is implemented through aperture scanning by an LCOS spatial light modulator at the back focal plane of the objective lens. This FPM configuration enables the capturing of the complex scattered field for a 3D sample both in the transmissive mode and the reflective mode. We further show that by combining with the compressive sensing theory, the reconstructed...
متن کاملModeling Extensions of Fourier Ptychographic Microscopy
Fourier ptychographic microscopy (FPM) is a recently introduced procedure that acquires highresolution (0.37 2 μm 2 ), wide field of view (120 mm 2 ) giga-pixel optical images [1]. Its operation closely parallels the principles supporting conventional ptychography, the well-known X-ray and electron imaging procedure. Instead of combining a sequence of diffraction images captured from a sample a...
متن کاملWide-field, high-resolution Fourier ptychographic microscopy
In this article, we report an imaging method, termed Fourier ptychographic microscopy (FPM), which iteratively stitches together a number of variably illuminated, low-resolution intensity images in Fourier space to produce a wide-field, high-resolution complex sample image. By adopting a wavefront correction strategy, the FPM method can also correct for aberrations and digitally extend a micros...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: IEEE Access
سال: 2018
ISSN: 2169-3536
DOI: 10.1109/access.2018.2849010